Glossary
A | B | C | D | E | H | I | K | L | M | N | O | P | R | S | T | U | V | X | Z
A
alpha value
assignable cause
attributes data
average
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B
bell curve
bias
bimodal distribution
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C
capability
capability analysis
capable process
c-chart
central location
central tendency
characteristic
chi-square
coefficient of variance
common cause
control charts
control limits
Cp
Cpk
Cpl
Cpm
Cpu
Cr
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D
defect
defective
discrimination
dispersion
distribution
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E
H
I
in control
individual control chart
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K
L
lower control limit
lower specification limit
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M
maximum acceptable subgroup size
mean
measurement system
median
minimum acceptable subgroup size
mode
moving range
moving range chart
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N
negatively skewed distribution
nonconforming
nonconformities
nonnormal data
nonnormal data distribution
nonrandom pattern
normal curve
normal distribution
normal probability plot
np-chart
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O
observation
operational definition
outlier
out-of-control
overcontrol
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P
Pareto chart
p-chart
positively skewed distribution
Pp
Ppk
Ppl
Ppu
Pr
process
process capability
process performance
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R
random distribution
random sample
range
repeatability
reproducibility
run chart
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S
sample
sample size
sigma of the individuals
sigma
skewed distribution
skewness
special cause
specification limits
spread
stable process
standard deviation
statistical control
subgroup
symmetrical distribution
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T
target value
trial limits
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U
u-chart
undercontrol
uniform distribution
unstable system
upper control limit
upper specification limit
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V
variability
variables
variation
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